Ramon Roche 2f54fd101f feat(bench): add storage and serial loopback tests from existing system commands ...

The firmware already ships sd_bench, sd_stress, and serial_test; the
suite was not exploiting them.

bench/storage_stress.py joins the default sequence before log_transfer
(storage health first, then the test that depends on storage). It runs
sd_bench with data verification and parses write/read throughput and
fsync latency into named checks with generous FAIL floors (defaults
justified in the README: 100 KB/s write, 200 KB/s read, 500 ms fsync;
a working-but-slow card prints a WARNING instead of flapping), then
sd_stress for file churn with a short default iteration count. Both
phases probe-and-skip independently: a firmware without a command or a
board without an SD card records SKIP with a warning, never FAIL.

bench/serial_loopback.py is a standalone operator/fixture test for
manufacturing: with a TX-RX loopback jumper installed on a chosen UART,
serial_test transmits a known pattern and the session summary
(rx/tx/rx err counts) plus pattern-error lines decide the verdict. Not
in the default sequence because it needs a physical fixture.

The firmware gate's --build path now prints a bench capability report
from one shared table: after reading default.px4board plus the label
overlay (labels merge both, cmake/kconfig.cmake:47-54) it lists whether
the image will contain simulator_sih, sd_bench, sd_stress, and
serial_test and which suite tests will run or skip. For anything
missing it names a sibling variant that has it (exact --target) and
the exact config line, and interactively offers to append the line to
the local board config, stating that the edit is local and uncommitted.
All four options are 'default n' in Kconfig, so the merged .px4board
lines decide presence.

Signed-off-by: Ramon Roche <mrpollo@gmail.com>

2026-07-07 21:33:15 -07:00

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